Optical Characterization of GaAs with MSM Stuctures

نویسندگان

  • Brian Ha
  • Roman Sobolewski
چکیده

1. Abstract There is a great demand for the ultrafast testing of high-speed electronic/optoelectroi~ic devices in various fields of science and engineering. Such testing can be achieved by electro-optic (EO) sanlpling systems that are capable of sampling picosecond voltage signals with subpicoseco~ld time resolution. Samples of gallium arsenide (GaAs), a semiconductor, with metal-semiconductor-metal (MSM) diodes were tested on the EO sampling system. The fastest sample tested produced an electrical transient with a rise time of 330 fs and a full-width at half-maxinlum (FWHM) of approxinlately 5 10 fs.

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تاریخ انتشار 2008